期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
Improve the Quality of Per-Test Fault Diagnosis Using Output InformationCHUNSHENG LIU; P. C. Maxwell20072007, vol.23, no.1
Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open FaultsUGUR CILiNGIROGLU; M. Sachdev20072007, vol.23, no.1
Isolation of Failing Scan Cells through Convolutional Test Response CompactionGRZEGORZ MRUGALSKI; JANUSZ RAJSKI; CHEN WANG; ARTUR POGIEL; JERZY TYSZER; C. Laudrault20072007, vol.23, no.1
Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAsL. STERPONE; M. SONZA REORDA; M. VIOLANTE; F. LIMA KASTENSMIDT; L. CARRO; C. E. Stroud20072007, vol.23, no.1
Minimal March Tests for Detection of Dynamic Faults in Random Access MemoriesG. HARUTUNYAN; V. A. VARDANIAN; Y. ZORIAN; J. P. Hayes20072007, vol.23, no.1
Generation of Primary Input Blocking Pattern for Power Minimization during Scan TestingWANG-DAUH TSENG; C. A. Papachristou20072007, vol.23, no.1
RF Testing on a Mixed Signal TesterDANA BROWN; JOHN FERRARIO; RANDY WOLF; JING LI; JAYENDRA BHAGAT; MUSTAPHA SLAMANI; S. Mir20072007, vol.23, no.1
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data ConvertersSHALABH GOYAL; ABHIJIT CHATTERJEE; MICHAEL PURTELL; S. MIR20072007, vol.23, no.1



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