期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
Eliminating the Timing Penalty of ScanOzgur Sinanoglu; Vishwani D. Agrawal20132013, vol.29, no.1
Analog Circuits Fault Detection Using Cross-Entropy ApproachXifeng Li; Yongle Xie20132013, vol.29, no.1
Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed RandomlyViktor Mashkov; Jiri Barilla; Pavel Simr20132013, vol.29, no.1
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical FaultsFang Bao; Ke Peng; Mahmut Yilmaz; Krishnendu Chakrabarty; LeRoy Winemberg; Mohammad Tehranipoor20132013, vol.29, no.1
Testing of Synchronizers in Asynchronous FIFOHyoung-Kook Kim; Laung-Temg Wang; Yu-Liang Wu; Wen-Ben Jone20132013, vol.29, no.1
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power ConstraintsSobeeh Almukhaizim; Sara Bunian; Ozgur Sinanoglu20132013, vol.29, no.1
SEU Fault-Injection in VHDL-Based Processors: A Case StudyWassim Mansour; Raoul Velazco20132013, vol.29, no.1
Evaluating Different Strategies for Testing Software Product LinesThelma Elita Colanzi; Wesley Klewerton Guez Assuncao; Daniela de Freitas Guilhermino Trindade; Carlos Alberto Zorzo; Silvia Regina Vergilio20132013, vol.29, no.1
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis DistanceHan Han; Houjun Wang; Shulin Tian; Na Zhang20132013, vol.29, no.1



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