期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
Eliminating the Timing Penalty of ScanOzgur Sinanoglu; Vishwani D. Agrawal20132013, vol.29, no.1
Analog Circuits Fault Detection Using Cross-Entropy ApproachXifeng Li; Yongle Xie20132013, vol.29, no.1
Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed RandomlyViktor Mashkov; Jiri Barilla; Pavel Simr20132013, vol.29, no.1
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical FaultsFang Bao; Ke Peng; Mahmut Yilmaz; Krishnendu Chakrabarty; LeRoy Winemberg; Mohammad Tehranipoor20132013, vol.29, no.1
Testing of Synchronizers in Asynchronous FIFOHyoung-Kook Kim; Laung-Temg Wang; Yu-Liang Wu; Wen-Ben Jone20132013, vol.29, no.1
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power ConstraintsSobeeh Almukhaizim; Sara Bunian; Ozgur Sinanoglu20132013, vol.29, no.1
SEU Fault-Injection in VHDL-Based Processors: A Case StudyWassim Mansour; Raoul Velazco20132013, vol.29, no.1
Evaluating Different Strategies for Testing Software Product LinesThelma Elita Colanzi; Wesley Klewerton Guez Assuncao; Daniela de Freitas Guilhermino Trindade; Carlos Alberto Zorzo; Silvia Regina Vergilio20132013, vol.29, no.1
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis DistanceHan Han; Houjun Wang; Shulin Tian; Na Zhang20132013, vol.29, no.1



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