期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
On the Simulation of HCI-Induced Variations of IC Timings at High LevelOlivier Heron; Clement Bertolini; Chiara Sandionigi; Nicolas Ventroux; Francois Marc20132013, vol.29, no.2
CEP: Correlated Error Propagation for Hierarchical Soft Error AnalysisLiang Chen; Mojtaba Ebrahimi; Mehdi B. Tahoori20132013, vol.29, no.2
Self-Adaptive Fault Tolerance in Multi-/Many-Core SystemsCristiana Bolchini; Matteo Carminati; Antonio Miele20132013, vol.29, no.2
Reliability-Aware Heterogeneous 3D Chip Multiprocessor DesignIsmail Akturk; Ozcan Ozturk20132013, vol.29, no.2
Circuit Level Concurrent Error Detection in FSMsNatalja Kehl; Wolfgang Rosenstiel20132013, vol.29, no.2
Secure JTAG Implementation Using Schnorr ProtocolAmitabh Das; Jean Da Rolt; Santosh Ghosh; Stefaan Seys; Sophie Dupuis; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Ingrid Verbauwhede20132013, vol.29, no.2
Detailed Analysis of Compilation Options for Robust Software-based Embedded SystemsS. Bergaoui; A. Wecxsteen; R. Leveugle20132013, vol.29, no.2
Manipulation of Training Sets for Improving Data Mining Coverage-Driven VerificationEdgar Leonardo Romero; Marius Strum; Wang Jiang Chau20132013, vol.29, no.2
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural NetworksA. Kavithamani; V. Manikandan; N. Devarajan20132013, vol.29, no.2
Novel Self-Timed, Pipelined Clock Scan ArchitectureKanad Chakraborty; James E. Kelly; Brian P. Evans20132013, vol.29, no.2
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