期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
On the Simulation of HCI-Induced Variations of IC Timings at High LevelOlivier Heron; Clement Bertolini; Chiara Sandionigi; Nicolas Ventroux; Francois Marc20132013, vol.29, no.2
CEP: Correlated Error Propagation for Hierarchical Soft Error AnalysisLiang Chen; Mojtaba Ebrahimi; Mehdi B. Tahoori20132013, vol.29, no.2
Self-Adaptive Fault Tolerance in Multi-/Many-Core SystemsCristiana Bolchini; Matteo Carminati; Antonio Miele20132013, vol.29, no.2
Reliability-Aware Heterogeneous 3D Chip Multiprocessor DesignIsmail Akturk; Ozcan Ozturk20132013, vol.29, no.2
Circuit Level Concurrent Error Detection in FSMsNatalja Kehl; Wolfgang Rosenstiel20132013, vol.29, no.2
Secure JTAG Implementation Using Schnorr ProtocolAmitabh Das; Jean Da Rolt; Santosh Ghosh; Stefaan Seys; Sophie Dupuis; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Ingrid Verbauwhede20132013, vol.29, no.2
Detailed Analysis of Compilation Options for Robust Software-based Embedded SystemsS. Bergaoui; A. Wecxsteen; R. Leveugle20132013, vol.29, no.2
Manipulation of Training Sets for Improving Data Mining Coverage-Driven VerificationEdgar Leonardo Romero; Marius Strum; Wang Jiang Chau20132013, vol.29, no.2
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural NetworksA. Kavithamani; V. Manikandan; N. Devarajan20132013, vol.29, no.2
Novel Self-Timed, Pipelined Clock Scan ArchitectureKanad Chakraborty; James E. Kelly; Brian P. Evans20132013, vol.29, no.2
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