期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
On the Delay of a CNTFET with Undeposited CNTs by Gate Width AdjustmentGeunho Cho; Fabrizio Lombardi20132013, vol.29, no.3
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and DefectsYiwen Shi; Jennifer Dworak20132013, vol.29, no.3
Process Variations-Aware Statistical Analysis Framework for Aging Sensors InsertionJ. C. Vazquez; V. Champac; J. Semiao; I. C. Teixeira; M. B. Santos; J. P. Teixeira20132013, vol.29, no.3
A Practical Approach to Single Event Transient Analysis for Highly Complex DesignEnrico Costenaro; Dan Alexandrescu; Kader Belhaddad; Michael Nicolaidis20132013, vol.29, no.3
A Probabilistic Approach to Diagnose SETs in Sequential CircuitsSreenivas Gangadhar; Spyros Tragoudas20132013, vol.29, no.3
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational LogicRodrigo Possamai Bastos; Giorgio Di Natale; Marie-Lise Flottes; Feng Lu; Bruno Rouzeyre20132013, vol.29, no.3
A Preliminary Study about SEU Effects on Programmable Interconnections of SRAM-based FPGAsM. Alderighi; F. Casini; S. D'Angelo; A. Gravina; V. Liberali; M. Mancini; P. Musazzi; S. Pastore; M. Sassi; G. Sorrenti20132013, vol.29, no.3
On the Impact of Performance Faults in Modern MicroprocessorsNaghmeh Karimi; Michail Maniatakos; Chandrasekharan (Chandra) Tirumurti; Yiorgos Makris20132013, vol.29, no.3
Fault Analysis and Evaluation of a True Random Number Generator Embedded in a ProcessorMathilde Soucarros; Jessy Clediere; Cecile Dumas; Philippe Elbaz-Vincent20132013, vol.29, no.3
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case StudyThierry Bonnoit; Michael Nicolaidis; Nacer-Eddine Zergainoh20132013, vol.29, no.3
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