期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA DesignC. Thibeault; Y. Hariri; S. R. Hasan; C. Hobeika; Y. Savaria; Y. Audet; F. Z. Tazi20132013, vol.29, no.4
Neural Network Guided Spatial Fault Resilience in Array ProcessorsSuraj Sindia; Vishwani D. Agrawal20132013, vol.29, no.4
A Fault Tolerant Hierarchical Network on Chip Router ArchitectureM. H. Neishaburi; Zeljko Zilic20132013, vol.29, no.4
Process-Variation and Temperature Aware SoC Test Scheduling TechniqueNima Aghaee; Zebo Peng; Petru Eles20132013, vol.29, no.4
Efficient Worst-Case Temperature Evaluation for Thermal-Aware Assignment of Real-Time Applications on MPSoCsLars Schor; Iuliana Bacivarov; Hoeseok Yang; Lothar Thiele20132013, vol.29, no.4
High Efficiency Time Redundant Hardened Latch for Reliable Circuit DesignRahebeh Niaraki Asli; Saeideh Shirinzadeh20132013, vol.29, no.4
Timing-Error-Detecting Dual-Edge-Triggered Flip-FlopKazuteru Namba; Takashi Katagiri; Hideo Ito20132013, vol.29, no.4
An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault DiagnosisYongcai Ao; Yibing Shi; Wei Zhang; Yanjun Li20132013, vol.29, no.4
Prognostics of Analog Filters Based on Particle Filters Using Frequency FeaturesMin Li; Weiming Xian; Bing Long; Houjun Wang20132013, vol.29, no.4
A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding LogicTie-Bin Wu; Heng-Zhu Liu; Peng-Xia Liu; Dong-Sheng Guo; Hai-Ming Sun20132013, vol.29, no.4
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