期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.29, no.1 2013, vol.29, no.2 2013, vol.29, no.3 2013, vol.29, no.4 2013, vol.29, no.5 2013, vol.29, no.6

题名作者出版年年卷期
Physics-Based Low-Cost Test Technique for High Voltage LDMOSSukeshwar Kannan; Kaushal Kannan; Bruce C. Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian; Kenneth M. Butler; Doug Mirizzi20132013, vol.29, no.6
Online Testable Approaches in Reversible LogicN. M. Nayeem; J. E. Rice20132013, vol.29, no.6
Autonomous Fault-Tolerant Systems onto SRAM-based FPGA PlatformsCristiana Bolchini; Antonio Miele; Chiara Sandionigi20132013, vol.29, no.6
Effective Timing Error Tolerance in Flip-Flop Based Core DesignsStefanos Valadimas; Yiorgos Tsiatouhas; Angela Arapoyanni; Petros Xarchakos20132013, vol.29, no.6
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial ReconfigurationAlexandros Vavousis; Andreas Apostolakis; Mihalis Psarakis20132013, vol.29, no.6
Selective SWIFT-R: A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded SystemsFelipe Restrepo-Calle; Antonio Martinez-Alvarez; Sergio Cuenca-Asensi; Antonio Jimeno-Morenilla20132013, vol.29, no.6
MoDiVHA: A Hierarchical Strategy for Distributed Test AssignmentJefferson P. Koppe; Elias P. Duarte, Jr.; Luis C. E. Bona20132013, vol.29, no.6
Efficient Test Compression Technique for SoC Based on Block Merging and Eight CodingTie-Bin Wu; Heng-Zhu Liu; Peng-Xia Liu20132013, vol.29, no.6
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault ModelingLikun Xia; Muhammad Umer Farooq; Ian M. Bell; Fawnizu Azmadi Hussin; Aamir Saeed Malik20132013, vol.29, no.6
Multi-bit Sigma-Delta TDC Architecture with Improved LinearitySatoshi Uemori; Masamichi Ishii; Haruo Kobayashi; Daiki Hirabayashi; Yuta Arakawa; Yuta Doi; Osamu Kobayashi; Tatsuji Matsuura; Kiichi Niitsu; Yuji Yano; Tatsuhiro Gake; Takahiro J. Yamaguchi; Nobukazu Takai20132013, vol.29, no.6
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