期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20162016, vol.32, no.1
A Built-in Single Event Upsets Detector for Sequential CellsLi, Yuanqing; Wang, Haibin; Chen, Li; Liu, Rui; Chen, Mo; Li, Lixiang20162016, vol.32, no.1
Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test ClocksHu, Cong; Li, Zhi; Xu, Chuanpei; Jia, Mengyi20162016, vol.32, no.1
Optimization of a Particles Detection Chain Based on a VCO StructureCoulie-Castellani, K.; Rahajandraibe, W.; Micolau, G.; Aziza, H.; Portal, J. -M.20162016, vol.32, no.1
Simulation-based Fault Injection with QEMU for Speeding-up Dependability Analysis of Embedded SoftwareFerraretto, Davide; Pravadelli, Graziano20162016, vol.32, no.1
A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length CodingYuan, Haiying; Guo, Kun; Sun, Xun; Ju, Zijian20162016, vol.32, no.1
Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection (vol 31, pg 525, 2015)Goren, Sezer; Gursoy, Cemil Cem; Yildiz, Abdullah20162016, vol.32, no.1
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATEAzais, Florence; David-Grignot, Stephane; Latorre, Laurent; Lefevre, Francois20162016, vol.32, no.1
Practical Analog Circuit Diagnosis Based on Fault Features with Minimum AmbiguitiesTang, Xiaofeng; Xu, Aiqiang20162016, vol.32, no.1
Layout-based Single Event Mitigation Techniques for Dynamic Logic CircuitsWang, Haibin; Li, Mulong; Dai, Xixi; Shi, Shuting; Chen, Li; Guo, Gang20162016, vol.32, no.1



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