期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
Exploration of Noise Impact on Integrated Bulk Current SensorsMourao Melo, Joao Guilherme; Torres, Frank Sill20162016, vol.32, no.2
UntitledAgrawal, Vishwani D.20162016, vol.32, no.2
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAMWu, Ming-Hsueh; Hsu, Chun-Lung; Chen, Chen-An; Luo, Kun-Lun20162016, vol.32, no.2
Exemplar-based Failure Triage for Regression Design DebuggingPoulos, Zissis; Veneris, Andreas20162016, vol.32, no.2
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event UpsetsLi, Yuanqing; Li, Lixiang; Ma, Yuan; Chen, Li; Liu, Rui; Wang, Haibin; Wu, Qiong; Newton, Michael; Chen, Mo20162016, vol.32, no.2
A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing CoresWali, I.; Virazel, Arnaud; Girard, P.; Pravossoudovitch, S.; Reorda, M. Sonza; Bosio, A.20162016, vol.32, no.2
An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible CircuitsNagamani, A. N.; Ashwin, S.; Abhishek, B.; Agrawal, V. K.20162016, vol.32, no.2
New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-BuildingCan, Yavuz; Kassim, Hassen; Fischer, Georg20162016, vol.32, no.2
Applications of Mixed-Signal Technology in Digital TestingLi, Baohu; Agrawal, Vishwani D.20162016, vol.32, no.2
A CMOS Ripple Detector for Voltage Regulator TestingOzmen, Cagatay; Dirican, Aydin; Tan, Nurettin; Margala, Martin; Hieu Nguyen20162016, vol.32, no.2
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