期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
Exploration of Noise Impact on Integrated Bulk Current SensorsMourao Melo, Joao Guilherme; Torres, Frank Sill20162016, vol.32, no.2
UntitledAgrawal, Vishwani D.20162016, vol.32, no.2
Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAMWu, Ming-Hsueh; Hsu, Chun-Lung; Chen, Chen-An; Luo, Kun-Lun20162016, vol.32, no.2
Exemplar-based Failure Triage for Regression Design DebuggingPoulos, Zissis; Veneris, Andreas20162016, vol.32, no.2
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event UpsetsLi, Yuanqing; Li, Lixiang; Ma, Yuan; Chen, Li; Liu, Rui; Wang, Haibin; Wu, Qiong; Newton, Michael; Chen, Mo20162016, vol.32, no.2
A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing CoresWali, I.; Virazel, Arnaud; Girard, P.; Pravossoudovitch, S.; Reorda, M. Sonza; Bosio, A.20162016, vol.32, no.2
An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible CircuitsNagamani, A. N.; Ashwin, S.; Abhishek, B.; Agrawal, V. K.20162016, vol.32, no.2
New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-BuildingCan, Yavuz; Kassim, Hassen; Fischer, Georg20162016, vol.32, no.2
Applications of Mixed-Signal Technology in Digital TestingLi, Baohu; Agrawal, Vishwani D.20162016, vol.32, no.2
A CMOS Ripple Detector for Voltage Regulator TestingOzmen, Cagatay; Dirican, Aydin; Tan, Nurettin; Margala, Martin; Hieu Nguyen20162016, vol.32, no.2
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