期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
An SEU-Resilient SRAM Bitcell in 65-nm CMOS TechnologyChen, Qingyu; Wang, Haibin; Chen, Li; Li, Lixiang; Zhao, Xing; Liu, Rui; Chen, Mo; Li, Xuantian20162016, vol.32, no.3
UntitledAgrawal, Vishwani D.20162016, vol.32, no.3
Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan ArchitecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, Konstantin20162016, vol.32, no.3
Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device TestingIshida, Masahiro; Nakura, Toru; Kusaka, Takashi; Komatsu, Satoshi; Asada, Kunihiro20162016, vol.32, no.3
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale CircuitsJenihhin, Maksim; Squillero, Giovanni; Copetti, Thiago Santos; Tihhomirov, Valentin; Kostin, Sergei; Gaudesi, Marco; Vargas, Fabian; Raik, Jaan; Reorda, Matteo Sonza; Poehls, Leticia Bolzani; Ubar, Raimund; Medeiros, Guilherme Cardoso20162016, vol.32, no.3
A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational CircuitsRaji, Mohsen; Ghavami, Behnam20162016, vol.32, no.3
Impact of Fin-Height on SRAM Soft Error Sensitivity and Cell StabilityVillacorta, Hector; Segura, Jaume; Champac, Victor20162016, vol.32, no.3
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life TimeCopetti, T.; Medeiros, G. Cardoso; Poehls, L. Bolzani; Vargas, F.20162016, vol.32, no.3
Security Path: An Emerging Design Methodology to Protect the FPGA IPs Against Passive/Active Design TamperingZamanzadeh, Sharareh; Jahanian, Ali20162016, vol.32, no.3
Side-Channel Information Characterisation Based on Cascade-Forward Back-Propagation Neural NetworkSaeedi, Ehsan; Hossain, Md Selim; Kong, Yinan20162016, vol.32, no.3
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