期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2016, vol.32, no.1 2016, vol.32, no.2 2016, vol.32, no.3 2016, vol.32, no.4 2016, vol.32, no.5 2016, vol.32, no.6

题名作者出版年年卷期
Special Issue on Analog, Mixed-Signal and RF TestingAgrawal, Vishwani D.20162016, vol.32, no.4
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural NetworksLin, Qian; Fu, Haipeng; He, Feifei; Cheng, Qianfu20162016, vol.32, no.4
A New Approach for Modeling Inconsistencies in Digital-Assisted Analog DesignUygur, Guerkan; Sattler, Sebastian M.20162016, vol.32, no.4
Guest Editorial: Analog, Mixed-Signal and RF TestingLeger, Gildas; Wegener, Carsten20162016, vol.32, no.4
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCsRenaud, Guillaume; Barragan, Manuel J.; Laraba, Asma; Stratigopoulos, Haralampos-G.; Mir, Salvador; Le-Gall, Herve; Naudet, Herve20162016, vol.32, no.4
A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/OBielby, Steven; Chowdhury, Azhar; Roberts, Gordon W.; Li, Yan20162016, vol.32, no.4
A Wideband Digital-to-Frequency Converter with Built-In Mechanism for Self-Interference MitigationBashir, Imran; Staszewski, Robert B.; Eliezer, Oren E.; Balsara, Poras T.20162016, vol.32, no.4
An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile MemoriesLeisenberger, Friedrich Peter; Schatzberger, Gregor20162016, vol.32, no.4
The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELMYu, WenXin; Sui, Yongbo; Wang, Junnian20162016, vol.32, no.4
Fault Diagnosis in Highly Dependable Medical Wearable SystemsOliveira, Cristina C.; da Silva, Jose Machado20162016, vol.32, no.4



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