期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4 2023, vol.39, no.5/6

题名作者出版年年卷期
2022 JETTA-TTTC Best Paper Award 20232023, vol.39, no.5/6
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA CellsMitchell-Moreno Joseph Herbert; Flores-Verdad Guillermo Espinosa20232023, vol.39, no.5/6
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition FieldChen Shouhong; Wang Tao; Huang Zhentao; Hou Xingna20232023, vol.39, no.5/6
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error DetectionLu Yufan; Chen Xin; Zhao Zhenyu20232023, vol.39, no.5/6
Effective Software Mutation-Test Using Program Instructions ClassificationAsghari Zeinab; Arasteh Bahman; Koochari Abbas20232023, vol.39, no.5/6
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary AlgorithmsBhattacharya Priyajit; Bhattacharya Rahul; Deka Himasree20232023, vol.39, no.5/6
Test Technology Newsletter 20232023, vol.39, no.5/6
A Survey of PCB Defect Detection AlgorithmsLakshmi Gayathri; Sankar V. Udaya; Sankar Y. Siva20232023, vol.39, no.5/6
Efficient Fault Detection by Test Case Prioritization via Test Case SelectionRajasingh J. Paul; Kumar P. Senthil; Srinivasan S.20232023, vol.39, no.5/6
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNNXiao Ying-Chun; Zhu Feng; Zhuang Shengxian; Yang Yang20232023, vol.39, no.5/6
123456



制造业外文文献服务平台