期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2018 2019 2020 2021 2022 2023

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4

题名作者出版年年卷期
Test Technology Newsletter 20232023, vol.39, no.2
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial NetworkTang Wenjing; Su Jing; Gao Yuchan20232023, vol.39, no.2
Multiple Retest Systems for Screening High-Quality ChipsYeh Chung-Huang; Chen Jwu E.20232023, vol.39, no.2
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern PermutationSong Tai; Huang Zhengfeng; Guo Xiaohui; Milos Krstic20232023, vol.39, no.2
Design of INV/BUFF Logic Locking For Enhancing the Hardware SecurityNaveenkumar R.; Sivamangai N. M.; Napolean A.; Priya S. Sridevi Sathya; Ashika S. V.20232023, vol.39, no.2
A Tunable Concurrent BIST Design Based on Reconfigurable LFSRMenbari Ahmad; Jahanirad Hadi20232023, vol.39, no.2
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan ShiftJiang Hui; Zhang Fanchen; Dworak Jennifer; Nepal Kundan; Manikas Theodore20232023, vol.39, no.2
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive ApplicationsMelis Tommaso; Simeu Emmanuel; Auvray Etienne; Saury Luc20232023, vol.39, no.2
EditorialAgrawal Vishwani D.20232023, vol.39, no.2
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF CircuitsEl Badawi H.; Azais F.; Bernard S.; Comte M.; Kerzerho V.; Lefevre F.20232023, vol.39, no.2



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