期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4

题名作者出版年年卷期
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A SurveyAsadi Bahareh; Zia Syed Maqsood; Al-Khafaji Hamza Mohammed Ridha; Mohamadian Asghar20232023, vol.39, no.1
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle BendsElliot Jake; Brown Jason20232023, vol.39, no.1
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction AlgorithmKumar Sakali Raghavendra; Mahammad Shak Noor20232023, vol.39, no.1
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site TestingBruce Isaac; Farayola Praise O.; Chaganti Shravan K.; Sheikh Abalhassan; Ravi Srivaths; Chen Degang20232023, vol.39, no.1
2022 Reviewers 20232023, vol.39, no.1
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive CircuitXiao Wenrun; Diao Jidong; Qiao Yanping; Liu Xianming; He Shan; Guo Donghui20232023, vol.39, no.1
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity DiagramDu Xiaozhi; Zhang Jinjin; Chen Kai; Zhou Yanrong20232023, vol.39, no.1
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes ActuationGhosh Sourav; Kumar Roy Surajit; Giri Chandan20232023, vol.39, no.1
EditorialAgrawal Vishwani D.20232023, vol.39, no.1
Test Technology Newsletter 20232023, vol.39, no.1
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