期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2024

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4 2023, vol.39, no.5/6

题名作者出版年年卷期
Test Technology Newsletter 20232023, vol.39, no.2
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial NetworkTang Wenjing; Su Jing; Gao Yuchan20232023, vol.39, no.2
Multiple Retest Systems for Screening High-Quality ChipsYeh Chung-Huang; Chen Jwu E.20232023, vol.39, no.2
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern PermutationSong Tai; Huang Zhengfeng; Guo Xiaohui; Milos Krstic20232023, vol.39, no.2
Design of INV/BUFF Logic Locking For Enhancing the Hardware SecurityNaveenkumar R.; Sivamangai N. M.; Napolean A.; Priya S. Sridevi Sathya; Ashika S. V.20232023, vol.39, no.2
A Tunable Concurrent BIST Design Based on Reconfigurable LFSRMenbari Ahmad; Jahanirad Hadi20232023, vol.39, no.2
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan ShiftJiang Hui; Zhang Fanchen; Dworak Jennifer; Nepal Kundan; Manikas Theodore20232023, vol.39, no.2
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive ApplicationsMelis Tommaso; Simeu Emmanuel; Auvray Etienne; Saury Luc20232023, vol.39, no.2
EditorialAgrawal Vishwani D.20232023, vol.39, no.2
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF CircuitsEl Badawi H.; Azais F.; Bernard S.; Comte M.; Kerzerho V.; Lefevre F.20232023, vol.39, no.2



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