期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2018 2019 2020 2021 2022 2023
2024

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4 2023, vol.39, no.5/6

题名作者出版年年卷期
Test Technology Newsletter 20232023, vol.39, no.3
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE SimulationsCoulié K.; Aziza H.; Rahajandraibe W.20232023, vol.39, no.3
Incomplete Testing of SOCSingh Kunwer Mrityunjay; Deka Jatindra; Biswas Santosh20232023, vol.39, no.3
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan DetectionRathor Vijaypal Singh; Singh Deepak; Singh Simranjit; Sajwan Mohit20232023, vol.39, no.3
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF SystemsDeyati Sabyasachi; Muldrey Barry; Chatterjee Abhijit20232023, vol.39, no.3
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node UpsetsHuang Zhengfeng; Wang Hao; Ma Dongxing; Liang Huaguo; Ouyang Yiming; Yan Aibin20232023, vol.39, no.3
EditorialAgrawal Vishwani D.20232023, vol.39, no.3
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented TestingJoo? Benedikt; Schramm Dieter20232023, vol.39, no.3
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization AlgorithmArasteh Bahman; Gharehchopogh Farhad Soleimanian; Gunes Peri; Kiani Farzad; Torkamanian-Afshar Mahsa20232023, vol.39, no.3
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated CircuitsBiswal Pradeep Kumar20232023, vol.39, no.3



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