期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2023, vol.39, no.1 2023, vol.39, no.2 2023, vol.39, no.3 2023, vol.39, no.4 2023, vol.39, no.5/6

题名作者出版年年卷期
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan DetectionDhar, Tapobrata; Das, Ranit; Giri, Chandan; Roy, Surajit Kumar20232023, vol.39, no.4
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate SystemsBalen, Tiago R.; Gonzalez, Carlos J.; Oliveira, Ingrid F. V.; da Rosa, Leomar S.; Soares, Rafael I.; Schvittz, Rafael B.; Added, Nemitala; Guazzelli, Marcilei A.; Medina, Nilberto H.; Butzen, Paulo F.; Macchione, Eduardo L. A.; Aguiar, Vitor A. P.20232023, vol.39, no.4
EditorialAgrawal, Vishwani D.20232023, vol.39, no.4
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test SystemChippalkatti, Vinod S.; Biradar, Rajashekhar C.; Shenoy, Venkatesh; Udayakumar, P.20232023, vol.39, no.4
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation PatternsZhang, Ling20232023, vol.39, no.4
New Second-order Threshold Implementation of Sm4 Block CipherShao, Tianyi; Wei, Bohua; Ou, Yu; Wei, Yongzhuang; Wu, Xiaonian20232023, vol.39, no.4
E 3 C Techniques for Protecting NAND Flash MemoriesLu, Shyue-Kung; Tsai, Zeng-Long20232023, vol.39, no.4
Test Technology Newsletter[Anonymous]20232023, vol.39, no.4
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting ModelSharma, Richa; Sharma, G. K.; Pattanaik, Manisha; Prashant, V. S. S.20232023, vol.39, no.4
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural NetworkRam, R. Saravana; Prabhaker, M. Lordwin Cecil20232023, vol.39, no.4



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