期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Datapath BIST Insertion Using Pre-Characterized Area and Testability DataJ. C. WANG; P. S. CARDOSO; J. A. Q. GONZALEZ; M. STRUM; R. PIRES20042004, vol.20, no.4
On High-Quality, Low Energy Built-in Self Test Preparation at RT-LevelM. B. SANTOS; I. C. TEIXEIRA; J. P. TEIXEIRA; S. MANICH; L. BALADO; J. FIGUERAS20042004, vol.20, no.4
Searching for Global Test Costs Optimization in Core-Based SystemsERIKA COTA; LUIGI CARRO; MARCELO LUBASZEWSKI; ALEX ORAILOGLU20042004, vol.20, no.4
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test ProcedureF. AZAIS; S. BERNARD; Y. BERTRAND; M. COMTE; M. RENOVELL20042004, vol.20, no.4
Oscillation Test Strategy: A Case StudyEDUARDO ROMERO; GABRIELA PERETTI; CARLOS MARQUES20042004, vol.20, no.4
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP SystemsFABIAN VARGAS; RUBEM D. FAGUNDES; DANIEL BARROS, JR.; DIOGO B. BRUM; EDUARDO RHOD20042004, vol.20, no.4
Simulating Single Event Transients in VDSM ICs for GroundDAN ALEXANDRESCU; LORENA ANGHEL; MICHAEL NICOLAIDIS20042004, vol.20, no.4
A New FPGA for DSP Applications Integrating BIST CapabilitiesALEX GONSALES; MICHEL RENOVELL; MARCELO LUBASZEWSKI; LUIGI CARRO20042004, vol.20, no.4
A New Approach to Software-Implemented Fault ToleranceM. REBAUDENGO; M. SONZA REORDA; M. VIOLANTE20042004, vol.20, no.4
Mutation Analysis and Constraint-Based Criteria: Results from an Empirical Evaluation in the Context of Software TestingINALI WISNIEWSKI SOARES; SILVIA REGINA VERGILIO20042004, vol.20, no.4
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