期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter DeviationsS. J. SPINKS; C. D. CHALK; I. M. BELL; M. ZWOLINSKI20042004, vol.20, no.1
Classification of Defective Analog Integrated Circuits Using Artificial Neural NetworksV. STOPJAKOVA; P. MALOSEK; D. MICUSIK; M. MATEJ; M. MARGALA20042004, vol.20, no.1
Control and Observation Structure for Analog Circuits with Current Test DataCHUN-LUNG HSU20042004, vol.20, no.1
A Graph-Based Approach to Power-Constrained SOC Test SchedulingCHIH-PIN SU; CHENG-WEN WU20042004, vol.20, no.1
Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power ConstraintsVALENTIN MURESAN; XIAOJUN WANG; VALENTINA MURESAN; MIRCEA VLADUTIU20042004, vol.20, no.1
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing TechniquesD. APPELLO; A. FUDOLI; V. TANCORRE20042004, vol.20, no.1
Testing and Reliability Techniques for High-Bandwidth Embedded RAMsKANAD CHAKRABORTY20042004, vol.20, no.1
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing CompactorO. NOVAK; Z. PLIVA; J. NOSEK; A. HLAWICZKA; T. GARBOLINO; K. GUCWA20042004, vol.20, no.1



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