期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Design of Embedded Self-Testing Checkers for UED and BUED CodesSTEFFEN TARNICK20042004, vol.20, no.5
An Analog Checker with Input-Relative Tolerance for Duplicate SignalsHARALAMPOS-G. D. STRATIGOPOULOS; YIORGOS MAKRIS20042004, vol.20, no.5
Efficient Realization of Parity Prediction Functions in FPGAsSEOK-BUM KO; JIEN-CHUNGLO20042004, vol.20, no.5
Model for Transient Fault Susceptibility of Combinational CircuitsMARTIN OMANA; DANIELE ROSSI; CECILIA METRA; M. Sonza Reorda20042004, vol.20, no.5
A New Approach to the Analysis of Single Event Transients in VLSI CircuitsM. SONZA REORDA; M. VIOLANTE20042004, vol.20, no.5
A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICsS. MATAKIAS; Y. TSIATOUHAS; A. ARAPOYANNI; TH. HANIOTAKIS20042004, vol.20, no.5
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft ErrorsANDRE K. NIEUWLAND; RICHARD P. KLEIHORST20042004, vol.20, no.5
A Two-Level Power-Grid Model for Transient Current Testing EvaluationB. ALORDA; V. CANALS; J. SEGURA20042004, vol.20, no.5
Error Detection Enhancement in COTS Superscalar Processors with Performance Monitoring FeaturesAMIR RAJABZADEH; SEYED GHASSEM MIREMADI; MIRZAD MOHANDESPOUR20042004, vol.20, no.5



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