期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access MemoriesPETRU CASCAVAL; STUART BENNETT; CORNELIU HUTANU20042004, vol.20, no.3
Memory Fault Modeling Trends: A Case StudySAID HAMDIOUI; ROB WADSWORTH; JOHN DELOS REYES; AD J. VAN DE GOOR20042004, vol.20, no.3
Efficiency of Spectral-Based ADC Test Flows to Detect Static ErrorsS. BERNARD; M. COMTE; F. AZAIS; Y. BERTRAND; M. RENOVELL20042004, vol.20, no.3
Code Generation for Functional Validation of Pipelined MicroprocessorsF. CORNO; E. SANCHEZ; M. SONZA REORDA; G. SQUILLERO20042004, vol.20, no.3
Application-Specific Bridging Fault Testing of FPGAsMEHDI BARADARAN TAHOORI20042004, vol.20, no.3
Distributed Diagnosis of Interconnections in SoC and MCM DesignsRAJESH PENDURKAR; ABHIJIT CHATTERJEE; YERVANT ZORIAN20042004, vol.20, no.3
A Note on System-on-Chip Test Scheduling FormulationSANDEEP KORANNE20042004, vol.20, no.3
New Non-Scan DFT Techniques to Achieve 100% Fault EfficiencyDEBESH KUMAR DAS; SATOSHI OHTAKE; HIDEO FUJIWARA20042004, vol.20, no.3



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