期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
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2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Abort-on-Fail Based Test SchedulingERIK LARSSON; JULIEN POUGET; ZEBO PENG20052005, vol.21, no.6
The Coupling Model for Function and Delay FaultsJOONHWAN YI; JOHN P. HAYES20052005, vol.21, no.6
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect DevicesBAOSHENG WANG; ANDY KUO; TOURAJ FARAHMAND; ANDRE IVANOV; YONG B. CHO; SASSAN TABATABAEI20052005, vol.21, no.6
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan TreesH. YOTSUYANAGI; T. KUCHII; S. NISHIKAWA; M. HASHIZUME; K. KINOSHITA20052005, vol.21, no.6
Multiple-Constraint Driven System-on-Chip Test Time OptimizationJULIEN POUGET; ERIK LARSSON; ZEBO PENG20052005, vol.21, no.6
Fault Detection in Switched Current Circuits Using Built-in Transient Current SensorsY. LECHUGA; R. MOZUELOS; M. A. ALLENDE; M. MARTINEZ; S. BRACHO20052005, vol.21, no.6
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST CircuitJEE-YOUL RYU; BRUCE C. KIM20052005, vol.21, no.6
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM MemoriesLUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL; SIMONE BORRI; MAGALI HAGE-HASSAN; C. Landrault20052005, vol.21, no.5
Concurrent Error Detection in a Bit-Parallel Systolic Multiplier for Dual Basis of GF(2{sup}m)CHIOU-YNG LEE; CHE WUN CHIOU; JIM-MIN LIN; H. J. Wunderlich20052005, vol.21, no.5
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and ImplementationSANTOSH BISWAS; SIDDHARTHA MUKHOPADHYAY; AMIT PATRA; N. K. Jha20052005, vol.21, no.5
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