期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
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2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
An On-Chip Spectrum Analyzer for Analog Built-in TestingMARCIA G. MENDEZ-RIVERA; ALBERTO VALDES-GARCIA; JOSE SILVA-MARTINEZ; EDGAR SANCHEZ-SINENCIO20052005, vol.21, no.3
Sine-Wave Signal Characterization Using Square-Wave and ∑△-Modulation: Application to Mixed-Signal BISTDIEGO VAZQUEZ; GLORIA HUERTAS; AFRICA LUQUE; MANUEL J. BARRAGAN; GILDAS LEGER; ADORACION RUEDA; JOSE L. HUERTAS20052005, vol.21, no.3
On-Chip Pseudorandom MEMS TestingL. RUFER; S. MIR; E. SIMEU; C. DOMINGUES20052005, vol.21, no.3
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply CurrentSWARUP BHUNIA; ARIJIT RAYCHOWDHURY; KAUSHIK ROY20052005, vol.21, no.3
Testing Biquad Filters under Parametric Shifts Using X-Y ZoningR. SANAHUJA; V. BARCONS; L. BALADO; J. FIGUERAS20052005, vol.21, no.3
Detection and Evaluation of Deterministic Jitter Causes in CP-PLL's Due to Macro Level Faults and Pre-Detection Using Simple MethodsMARTIN JOHN BURBIDGE20052005, vol.21, no.3
Low cost BIST for static and dynamic testing of ADCsMARIA DA GLORIA FLORES; MARCELO NEGREIROS; LUIGI CARRO; ALTAMIRO A. SUSIN; FELIPE R. CLAYTON; CRISTIANO BENEVENTO20052005, vol.21, no.3
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to SpecificationsF. AZAIS; S. BERNARD; Y. BERTRAND; M. COMTE; M. RENOVELL20052005, vol.21, no.3
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCsCARSTEN WEGENER; MICHAEL PETER KENNEDY20052005, vol.21, no.3
Multi-VDD Testing for Analog CircuitsJOSE PINEDA DE GYVEZ; GUIDO GRONTHOUD; RACHID AMINE20052005, vol.21, no.3
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