期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Error Diagnosis of Sequential Circuits Using Region-Based ModelANAND L. D'SOUZA; MICHAEL S. HSIAO; W. K. Fuchs20052005, vol.21, no.2
An Analog Circuit Fault Characterization MethodologyYVAN MAIDON; THOMAS ZIMMER; ANDRE IVANOV20052005, vol.21, no.2
Applying the Oscillation Test Strategy to FPAA's Configurable Analog BlocksTIAGO R. BALEN; ANTONIO Q. ANDRADE, JR.; FLORENCE AZAIS; MARCELO LUBASZEWSKI; MICHEL RENOVELL20052005, vol.21, no.2
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply CurrentSWARUP BHUNIA; ARIJIT RAYCHOWDHURY; KAUSHIK ROY20052005, vol.21, no.2
Phase Shifter MergingDIMITRI KAGARIS20052005, vol.21, no.2
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory TestSIMONE BORRI; MAGALI HAGE-HASSAN; LUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL20052005, vol.21, no.2
Selection of Crosstalk-Induced Faults in Enhanced Delay TestHUAWEI LI; XIAOWEI LI20052005, vol.21, no.2



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