期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Defect Detection Using Quiescent Signal AnalysisCHINTAN PATEL; ABHISHEK SINGH; JIM PLUSQUELLIC20052005, vol.21, no.5
Incremental Design Debugging in a Logic Synthesis EnvironmentANDREAS VENERIS; JIANG BRANDON LIU; J. Figueras20052005, vol.21, no.5
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPGANDREAS VENERIS; ROBERT CHANG; MAGDY S. ABADIR; SEP SEYEDI; A. J. van de Goor20052005, vol.21, no.5
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and ImplementationSANTOSH BISWAS; SIDDHARTHA MUKHOPADHYAY; AMIT PATRA; N. K. Jha20052005, vol.21, no.5
Concurrent Error Detection in a Bit-Parallel Systolic Multiplier for Dual Basis of GF(2{sup}m)CHIOU-YNG LEE; CHE WUN CHIOU; JIM-MIN LIN; H. J. Wunderlich20052005, vol.21, no.5
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM MemoriesLUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL; SIMONE BORRI; MAGALI HAGE-HASSAN; C. Landrault20052005, vol.21, no.5



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