期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
A Strategy for Optimal Test Point Insertion in Analog Cascaded FiltersF. AZAIS; M. LUBASZEWSKI; P. NOUET; M. RENOVELL20052005, vol.21, no.1
Optimal Interconnect ATPG Under a Ground-Bounce ConstraintHENK D. L. HOLLMANN; ERIK JAN MARINISSEN; BART VERMEULEN20052005, vol.21, no.1
EEPROM Diagnosis Based on Threshold Voltage Embedded MeasurementJ. M. PORTAL; H. AZIZA; D. NEE20052005, vol.21, no.1
Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAsPATRICK GIRARD; OLIVIER HERON; SERGE PRAVOSSOUDOVITCH; MICHEL RENOVELL20052005, vol.21, no.1
Modeling Feedback Bridging Faults with Non-Zero ResistanceILIA POLIAN; PIET ENGELKE; MICHEL RENOVELL; BERND BECKER20052005, vol.21, no.1
A New Testability Calculation Method to Guide RTL Test GenerationJAAN RAIK; TANEL NOMMEOTS; RAIMUND UBAR20052005, vol.21, no.1
A Degree-of-Freedom Based Synthesis Scheme for Sequential Machines with Enhanced BIST Quality and Reduced AreaBIPLAB K. SIKDAR; S. ROY; DEBESH K. DAS20052005, vol.21, no.1
Design of Nonlinear CA Based TPG Without Prohibited Pattern Set In Linear TimeSUKANTA DAS; ANIRBAN KUNDU; BIPLAB K. SIKDAR; P. PAL CHAUDHURI20052005, vol.21, no.1



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