期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
An On-Chip Spectrum Analyzer for Analog Built-in TestingMARCIA G. MENDEZ-RIVERA; ALBERTO VALDES-GARCIA; JOSE SILVA-MARTINEZ; EDGAR SANCHEZ-SINENCIO20052005, vol.21, no.3
Sine-Wave Signal Characterization Using Square-Wave and ∑△-Modulation: Application to Mixed-Signal BISTDIEGO VAZQUEZ; GLORIA HUERTAS; AFRICA LUQUE; MANUEL J. BARRAGAN; GILDAS LEGER; ADORACION RUEDA; JOSE L. HUERTAS20052005, vol.21, no.3
On-Chip Pseudorandom MEMS TestingL. RUFER; S. MIR; E. SIMEU; C. DOMINGUES20052005, vol.21, no.3
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply CurrentSWARUP BHUNIA; ARIJIT RAYCHOWDHURY; KAUSHIK ROY20052005, vol.21, no.3
Testing Biquad Filters under Parametric Shifts Using X-Y ZoningR. SANAHUJA; V. BARCONS; L. BALADO; J. FIGUERAS20052005, vol.21, no.3
Detection and Evaluation of Deterministic Jitter Causes in CP-PLL's Due to Macro Level Faults and Pre-Detection Using Simple MethodsMARTIN JOHN BURBIDGE20052005, vol.21, no.3
Low cost BIST for static and dynamic testing of ADCsMARIA DA GLORIA FLORES; MARCELO NEGREIROS; LUIGI CARRO; ALTAMIRO A. SUSIN; FELIPE R. CLAYTON; CRISTIANO BENEVENTO20052005, vol.21, no.3
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to SpecificationsF. AZAIS; S. BERNARD; Y. BERTRAND; M. COMTE; M. RENOVELL20052005, vol.21, no.3
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCsCARSTEN WEGENER; MICHAEL PETER KENNEDY20052005, vol.21, no.3
Multi-VDD Testing for Analog CircuitsJOSE PINEDA DE GYVEZ; GUIDO GRONTHOUD; RACHID AMINE20052005, vol.21, no.3
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