期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a ChipD. BARROS JUNIOR; M. RODRIGUEZ-IRAGO; M. B. SANTOS; I. C. TEIXEIRA; F. VARGAS; J. P. TEIXEIRA20052005, vol.21, no.4
Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability EvaluationA. AMMARI; K. HADJIAT; R. LEVEUGLE20052005, vol.21, no.4
Self-Checking Voter for High Speed TMR SystemsJOSE MANUEL CAZEAUX; DANIELE ROSSI; CECILIA METRA20052005, vol.21, no.4
Single- and Double-Output Embedded Checker Architectures for Systematic Unordered CodesSTEFFEN TARNICK20052005, vol.21, no.4
The Integration of On-Line Monitoring and Reconfiguration Functions into a Safety Critical Automotive Electronic Control UnitC. JEFFREY; R. CUTAJAR; A. RICHARDSON; S. PROSSER; M. LICKESS; S. RICHES20052005, vol.21, no.4
Low Cost On-Line Testing Strategy for RF CircuitsMARCELO NEGREIROS; LUIGI CARRO; ALTAMIRO A. SUSIN20052005, vol.21, no.4
A Comparative Evaluation of Designs for Reliable Memory SystemsG. C. CARDARILLI; F. LOMBARDI; M. OTTAVI; S. PONTARELLI; M. RE; A. SALSANO20052005, vol.21, no.4
Tolerance Architectures for NanotechnologiesMICHAEL NICOLAIDIS; LORENA ANGHEL; NADIR ACHOURI20052005, vol.21, no.4



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