期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Defect Detection Using Quiescent Signal AnalysisCHINTAN PATEL; ABHISHEK SINGH; JIM PLUSQUELLIC20052005, vol.21, no.5
Incremental Design Debugging in a Logic Synthesis EnvironmentANDREAS VENERIS; JIANG BRANDON LIU; J. Figueras20052005, vol.21, no.5
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPGANDREAS VENERIS; ROBERT CHANG; MAGDY S. ABADIR; SEP SEYEDI; A. J. van de Goor20052005, vol.21, no.5
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and ImplementationSANTOSH BISWAS; SIDDHARTHA MUKHOPADHYAY; AMIT PATRA; N. K. Jha20052005, vol.21, no.5
Concurrent Error Detection in a Bit-Parallel Systolic Multiplier for Dual Basis of GF(2{sup}m)CHIOU-YNG LEE; CHE WUN CHIOU; JIM-MIN LIN; H. J. Wunderlich20052005, vol.21, no.5
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM MemoriesLUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL; SIMONE BORRI; MAGALI HAGE-HASSAN; C. Landrault20052005, vol.21, no.5



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