期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.21, no.1 2005, vol.21, no.2 2005, vol.21, no.3 2005, vol.21, no.4 2005, vol.21, no.5 2005, vol.21, no.6

题名作者出版年年卷期
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST CircuitJEE-YOUL RYU; BRUCE C. KIM20052005, vol.21, no.6
Fault Detection in Switched Current Circuits Using Built-in Transient Current SensorsY. LECHUGA; R. MOZUELOS; M. A. ALLENDE; M. MARTINEZ; S. BRACHO20052005, vol.21, no.6
Multiple-Constraint Driven System-on-Chip Test Time OptimizationJULIEN POUGET; ERIK LARSSON; ZEBO PENG20052005, vol.21, no.6
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan TreesH. YOTSUYANAGI; T. KUCHII; S. NISHIKAWA; M. HASHIZUME; K. KINOSHITA20052005, vol.21, no.6
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect DevicesBAOSHENG WANG; ANDY KUO; TOURAJ FARAHMAND; ANDRE IVANOV; YONG B. CHO; SASSAN TABATABAEI20052005, vol.21, no.6
The Coupling Model for Function and Delay FaultsJOONHWAN YI; JOHN P. HAYES20052005, vol.21, no.6
Abort-on-Fail Based Test SchedulingERIK LARSSON; JULIEN POUGET; ZEBO PENG20052005, vol.21, no.6



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