期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
An Efficient Compatibility-Based Test Data Compression and Its Decoder ArchitectureMin-yong Wan; Yong Ding; Yun Pan; Xiao-lang Yan20112011, vol.27, no.6
Security Against Hardware Trojan Attacks Using Key-Based Design ObfuscationRajat Subhra Chakraborty; Swarup Bhunia20112011, vol.27, no.6
Symmetry Measure for Memory Test and Its Application in BIST OptimizationGurgen Harutyunyan; Aram Hakhumyan; Samvel Shoukourian; Valery A. Vardanian; Yervant Zorian20112011, vol.27, no.6
Computing the Detection Probability for Small Delay Defects of Nanometer ICsJose L. Garcia-Gervacio; Victor Champac20112011, vol.27, no.6
Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear ProgrammingChen-Yuan Kao; Chien-Hui Liao; Charles H.-P. Wen20112011, vol.27, no.6
Calibrating On-chip Thermal Sensors in Integrated Circuits: A Design-for-Calibration ApproachChunhua Yao; Kewal K. Saluja; Parmesh Ramanathan20112011, vol.27, no.6
Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCsJin-Fu Lin; Hsin-Wen Ting20112011, vol.27, no.6
Band-Pass Filter Design with Diagnosis Facilities Based on Predictive TechniquesJoan Font-Rossello; Eugeni Isern; Miquel Roca; Rodrigo Picos; Miquel Font-Rossello; Eugenio Garcia-Moreno20112011, vol.27, no.6
Analog Circuit Fault Detection Using Location of PolesAshok Kavithamani; Venugopal Manikandan; Nanjundappan Devarajan20112011, vol.27, no.5
Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization TechniquesDebasis Mitra; Sarmishtha Ghoshal; Hafizur Rahaman; Krishnendu Chakrabarty; Bhargab B. Bhattacharya20112011, vol.27, no.5
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