期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
A New Design-for-Testability Method Based on Thru-TestabilityChia Yee Ooi; Hideo Fujiwara20112011, vol.27, no.5
Fault Diagnosis with Orthogonal Compactors in Scan-Based DesignsBrady Benware; Grzegorz Mrugalski; Artur Pogiel; Janusz Rajski; Jedrzej Solecki; Jerzy Tyszer20112011, vol.27, no.5
Wavelet Neural Network Approach for Testing of Switched-Current CircuitsGuo Jierong; He Yigang; Liu Meirong20112011, vol.27, no.5
Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection PredictionsGilles Foucard; Paul Peronnard; Raoul Velazco20112011, vol.27, no.5
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and RoutersMarcos Barcellos Herve; Marcelo Moraes; Pedro Almeida; Marcelo Lubaszewski; Fernanda Lima Kastensmidt; Erika Cota20112011, vol.27, no.5
A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnectZhu Jianfeng; He Hu; Wu Dong; Pan Liyang20112011, vol.27, no.5
Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization TechniquesDebasis Mitra; Sarmishtha Ghoshal; Hafizur Rahaman; Krishnendu Chakrabarty; Bhargab B. Bhattacharya20112011, vol.27, no.5
Analog Circuit Fault Detection Using Location of PolesAshok Kavithamani; Venugopal Manikandan; Nanjundappan Devarajan20112011, vol.27, no.5



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