期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined DatapathsMuhammad Nummer; Manoj Sachdev20112011, vol.27, no.1
Test Strategies for Electrode Degradation in Bio-Fluidic MicrosystemsQais Al-Gayem; Hongyuan Liu; Andrew Richardson; Nick Burd20112011, vol.27, no.1
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic GatesYang Zhao; Krishnendu Chakrabarty20112011, vol.27, no.1
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice OverlappingBin Zhou; Li-Yi Xiao; Yi-Zheng Ye; Xin-Chun Wu20112011, vol.27, no.1
A Design of Linearity Built-in Self-Test for Current-Steering DACHsin-Wen Ting; Soon-Jyh Chang; Su-Ling Huang20112011, vol.27, no.1
Masking of X-Values by Use of a Hierarchically Configurable RegisterThomas Rabenalt; Michael Goessel; Andreas Leininger20112011, vol.27, no.1
A New Built-in Defect-Based Testing Technique to Achieve Zero Defects in the Automotive EnvironmentVezio Malandruccolo; Mauro Ciappa; Hubert Rothleitner; Wolfgang Fichtner20112011, vol.27, no.1



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