期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test ChipKihyuk Han; Joonsung Park; Jae Wook Lee; Jaeyong Chung; Eonjo Byun; Cheol-Jong Woo; Sejang Oh; Jacob A. Abraham20112011, vol.27, no.4
Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADCsXuan-Lun Huang; Ping-Ying Kang; Yuan-Chi Yu; Jiun-Lang Huang20112011, vol.27, no.4
An Output Response Analyzer Circuit for ADC Built-in Self-TestHsin-Wen Ting20112011, vol.27, no.4
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response EvaluationGurusubrahmaniyan Subrahmaniyan Radhakrishnan; Sule Ozev20112011, vol.27, no.4
An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and ImplementationHaijun Sun; Yongjia Zeng; Pu Li; Shaochong Lei; Zhibiao Shao20112011, vol.27, no.4
A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage ModelingCarlos Ivan Castro Marquez; Edgar Leonardo Romero Tobar; Marius Strum; Wang Jiang Chau20112011, vol.27, no.4
Functional Verification of DMA ControllersMichelangelo Grosso; Wilson Javier Perez Holguin; Danilo Ravotto; Ernesto Sanchez; Matteo Sonza Reorda; Alberto Tonda; Jaime Velasco Medina20112011, vol.27, no.4
A Fault Detection Scheme for the FPGA Implementation of SHA-1 and SHA-512 Round ComputationsMohsen Bahramali; Jin Jiang; Arash Reyhani-Masoleh20112011, vol.27, no.4
A Java Framework to Specify Faultloads for Fault Injection CampaignsRuthiano Simioni Munaretti; Taisy Silva Weber; Sergio Luis Cechin; Bruno Coswig Fiss20112011, vol.27, no.4
Exploring the Limitations of Software-based Techniques in SEE Fault CoverageJose Rodrigo Azambuja; Samuel Pagliarini; Lucas Rosa; Fernanda Lima Kastensmidt20112011, vol.27, no.4
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