期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current SensorRoman Mozuelos; Yolanda Lechuga; Mar Martinez; Salvador Bracho20112011, vol.27, no.2
Construction and Analysis of Augmented Time CompactorsEmil Gizdarski20112011, vol.27, no.2
Balanced Secure Scan: Partial Scan Approach for Secret Information ProtectionMichiko Inoue; Tomokazu Yoneda; Muneo Hasegawa; Hideo Fujiwara20112011, vol.27, no.2
Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMsGiuseppe Di Guglielmo; Luigi Di Guglielmo; Franco Fummi; Graziano Pravadelli20112011, vol.27, no.2
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital ConvertersLe Jin20112011, vol.27, no.2
An Asynchronous Design for Testability and Implementation in Thin-film Transistor TechnologyChi-Hsuan Cheng; James Chien-Mo Li20112011, vol.27, no.2
Fault Tolerant Single Error Correction EncodersJuan Antonio Maestro; Pedro Reviriego; Costas Argyrides; Dhiraj K. Pradhan20112011, vol.27, no.2
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision ProblemsDesta Tadesse; R. Iris Bahar; Joel Grodstein20112011, vol.27, no.2
Analysis of Resistive Open Defects in Drowsy SRAM CellsAfshin Nourivand; Asim J. Al-Khalili; Yvon Savaria20112011, vol.27, no.2



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