期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2011, vol.27, no.1 2011, vol.27, no.2 2011, vol.27, no.3 2011, vol.27, no.4 2011, vol.27, no.5 2011, vol.27, no.6

题名作者出版年年卷期
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process VariationsMarvin Onabajo; Didac Gomez; Eduardo Aldrete-Vidrio; Josep Altet; Diego Mateo; Jose Silva-Martinez20112011, vol.27, no.3
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither SchemeSukeshwar Kannan; Bruce Kim; Ganesh Srinivasan; Friedrich Taenzlar; Richard Antley; Craig Force20112011, vol.27, no.3
Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTsDeepa Mannath; David Cohen; Victor Montano-Martinez; Rick Hudgens; Elida de-Obaldia; Shai Kush; Simon S. Ang20112011, vol.27, no.3
RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-RateGilles Fritz; Vincent Beroulle; Oum-El-Kheir Aktouf; Minh Due Nguyen; David Hely20112011, vol.27, no.3
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope SignaturesManuel J. Barragan; Rafaella Fiorelli; Gildas Leger; Adoracion Rueda; Jose L. Huertas20112011, vol.27, no.3
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test ResourcesNicolas Pous; Florence Azais; Laurent Latorre; Jochen Rivoir20112011, vol.27, no.3
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test ApplicationsManuel J. Barragan; Diego Vazquez; Adoracion Rueda20112011, vol.27, no.3
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series ModelJoonsung Park; Hongjoong Shin; Jacob A. Abraham20112011, vol.27, no.3
Digital Test Method for Embedded Converters with Unknown-Phase HarmonicsVincent Kerzerho; Mariane Comte; Florence Azais; Philippe Cauvet; Serge Bernard; Michel Renovell20112011, vol.27, no.3
Extending a DWDM Optical Network Test System to 12 Gbps x4 ChannelsCarl Edward Gray; David C. Keezer20112011, vol.27, no.3
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