期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC ConverterY. Ren; L. Fan; L. Chen; S. J. Wen; R. Wong; N. W. van Vonno; A. F. Witulski; B. L. Bhuva20122012, vol.28, no.6
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLABKanad Chakraborty; Vishwani D. Agrawal20122012, vol.28, no.6
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI WearoutJ. M. Ruiz; R. Fernandez-Garcia; I. Gil; M. Morata20122012, vol.28, no.6
Current State of the Mixed-Signal Test Bus 1149.4Jari Hannu; Juha Hakkinen; Juha-Veikko Voutilainen; Heli Jantunen; Markku Moilanen20122012, vol.28, no.6
A Non-Enumerative Technique for Measuring Path Correlation in Digital CircuitsStelios N. Neophytou; Kyriakos Christou; Maria K. Michael20122012, vol.28, no.6
Structural Test and Diagnosis for Graceful Degradation of NoC SwitchesAtefe Dalirsani; Stefan Holst; Melanie Elm; Hans-Joachim Wunderlich20122012, vol.28, no.6
K~(th)-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and DiagnosisVladimir Pasca; Lorena Anghel; Mounir Benabdenbi20122012, vol.28, no.6
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and RadiationJuliano Benfica; Leticia Maria Bolzani Poehls; Fabian Vargas; Jose Lipovetzky; Ariel Lutenberg; Edmundo Gatti; Fernando Hernandez20122012, vol.28, no.6
Prediction of Long-term Immunity of a Phase-Locked LoopA. Boyer; S. Ben Dhia; B. Li; C. Lemoine; B. Vrignon20122012, vol.28, no.6
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection ApproachM. Portela-Garcia; A. Lindoso; L. Entrena; M. Garcia-Valderas; C. Lopez-Ongil; N. Marroni; B. Pianta; L. Bolzani Poehls; F. Vargas20122012, vol.28, no.6
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