期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Built-in Self Test of RF Subsystems with Integrated DetectorsChaoming Zhang; Ranjit Gharpurey; Jacob A. Abraham20122012, vol.28, no.5
Experimental Results of Testing a BIST E-A ADC on the HOY Wireless Test PlatformShao-Feng Hung; Hao-Chiao Hong20122012, vol.28, no.5
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and MeasurementHyun Jin Kim; Jacob A. Abraham20122012, vol.28, no.5
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial SensorsElie H. Sarraf; Ankit Kansal; Mrigank Sharma; Edmond Cretu20122012, vol.28, no.5
On Chip Signal Generators for Low Overhead ADC BISTJingbo Duan; Bharath Vasan; Chen Zhao; Degang Chen; Randall Geiger20122012, vol.28, no.5
High Speed On-Chip Signal Generation for Debug and DiagnosisTsung-Yen Tsai; Sadok Aouini; Gordon Walter Roberts20122012, vol.28, no.5
Low-Distortion Sinewave Generation Method Using Arbitrary Waveform GeneratorKazuyuki Wakabayashi; Keisuke Kato; Takafumi Yamada; Osamu Kobayashi; Haruo Kobayashi; Fumitaka Abe; Kiichi Niitsu20122012, vol.28, no.5
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement CapabilityKemal Kulovic; Martin Margala20122012, vol.28, no.5
Novel Practical Built-in Current SensorsSamed Maltabas; Kemal Kulovic; Martin Margala20122012, vol.28, no.5
On the Use of Static Temperature Measurements as Process Variation ObservableDidac Gomez; Josep Altet; Diego Mateo20122012, vol.28, no.5
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