期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
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2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
ADC Multi-Site Test Based on a Pre-test with Digital Input StimulusXiaoqin Sheng; Hans Kerkhoff; Amir Zjajo; Guido Gronthoud20122012, vol.28, no.4
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model FittingShreyas Sen; Aritra Banerjee; Vishwanath Natarajan; Shyam Devarakond; Hyun Choi; Abhijit Chatterjee20122012, vol.28, no.4
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital CircuitsJudit F. Freijedo; Jorge Semiao; Juan J. Rodriguez-Andina; Fabian Vargas; Isabel C. Teixeira; J. Paulo Teixeira20122012, vol.28, no.4
On the Reuse of TLM Mutation Analysis at RTLValerio Guarnieri; Giuseppe Di Guglielmo; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar20122012, vol.28, no.4
Cohesive Coverage Management: Simulation Meets Formal MethodsAritra Hazra; Priyankar Ghosh; Pallab Dasgupta; Partha Pratim Chakrabarti20122012, vol.28, no.4
Time-Constraint-Aware Optimization of Assertions in Embedded SoftwareViacheslav Izosimov; Giuseppe Di Guglielmo; Michele Lora; Graziano Pravadelli; Franco Fummi; Zebo Peng; Masahiro Fujita20122012, vol.28, no.4
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation MethodMichal Tadeusiewicz; Stanislaw Halgas20122012, vol.28, no.4
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM AbstractionNicola Bombieri; Franco Fummi; Valerio Guarnieri20122012, vol.28, no.4
Identifying Untestable Faults in Sequential Circuits Using Test Path ConstraintsTaavi Viilukas; Anton Karputkin; Jaan Raik; Maksim Jenihhin; Raimund Ubar; Hideo Fujiwara20122012, vol.28, no.4
Yield Improvement for 3D Wafer-to-Wafer Stacked MemoriesMottaqiallah Taouil; Said Hamdioui20122012, vol.28, no.4
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