期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Digital-Compatible Testing Scheme for Operational AmplifierHsin-Wen Ting20122012, vol.28, no.3
A New Optimal Test Node Selection Method for Analog CircuitHui Luo; Youren Wang; Hua Lin; Yuanyuan Jiang20122012, vol.28, no.3
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency FeaturesBing Long; Shulin Tian; Houjun Wang20122012, vol.28, no.3
Iterative Antirandom TestingIreneusz Mrozek; Vyacheslav N. Yarmolik20122012, vol.28, no.3
Impact of Resistive-Bridging Defects in SRAM at Different Technology NodesRenan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine20122012, vol.28, no.3
Optimization of SEU Simulations for SRAM Cells Reliability under RadiationK. Castellani-Coulie; H. Aziza; G. Micolau; J.-M. Portal20122012, vol.28, no.3
IC Immunity Modeling Process Validation Using On-Chip MeasurementsS. Ben Dhia; A. Boyer; B. Vrignon; M. Deobarro20122012, vol.28, no.3
NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded SystemsCesare Ferri; Dimitra Papagiannopoulou; R. Iris Bahar; Andrea Calimera20122012, vol.28, no.3
Challenges for Semiconductor Test Engineering: A Review PaperStefan R. Vock; Omar J. Escalona; Colin Turner; Frank J. Owens20122012, vol.28, no.3
Robust Coupling Delay Test SetsJoonhwan Yi; John P. Hayes20122012, vol.28, no.3



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