期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2012 2013 2014 2015 2016 2017
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2024

2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
A Modified Simulation-Based Multi-Signal Modeling for Electronic SystemChen Xiaomei; Meng Xiaofeng; Wang Guohua20122012, vol.28, no.2
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable ResistorR. Ayadi; S. Mahresi; M. Masmoudi20122012, vol.28, no.2
Diagnostic Test Set Minimization and Full-Response Fault DictionaryMohammed Ashfaq Shukoor; Vishwani D. Agrawal20122012, vol.28, no.2
Software-Based Testing for System PeripheralsM. Grosso; W. J. Perez Holguin; E. Sanchez; M. Sonza Reorda; A. Tonda; J. Velasco Medina20122012, vol.28, no.2
A Layout-A ware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and CrosstalkJunxia Ma; Mohammad Tehranipoor; Patrick Girard20122012, vol.28, no.2
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL STAC eFlash MemoriesP.-D. Mauroux; A. Virazel; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovitch; B. Godard; G. Festes; L. Vachez20122012, vol.28, no.2
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test SensorsC. Thibeault; Y. Hariri; C. Hobeika20122012, vol.28, no.2
Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array LayoutsYang Zhao; Krishnendu Chakrabarty; Bhargab B. Bhattacharya20122012, vol.28, no.2
Fault Detection of Analog Circuits Using Network ParametersA. Kavithamani; V. Manikandan; N. Devarajan20122012, vol.28, no.2



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