期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Digital-Compatible Testing Scheme for Operational AmplifierHsin-Wen Ting20122012, vol.28, no.3
A New Optimal Test Node Selection Method for Analog CircuitHui Luo; Youren Wang; Hua Lin; Yuanyuan Jiang20122012, vol.28, no.3
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency FeaturesBing Long; Shulin Tian; Houjun Wang20122012, vol.28, no.3
Iterative Antirandom TestingIreneusz Mrozek; Vyacheslav N. Yarmolik20122012, vol.28, no.3
Impact of Resistive-Bridging Defects in SRAM at Different Technology NodesRenan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine20122012, vol.28, no.3
Optimization of SEU Simulations for SRAM Cells Reliability under RadiationK. Castellani-Coulie; H. Aziza; G. Micolau; J.-M. Portal20122012, vol.28, no.3
IC Immunity Modeling Process Validation Using On-Chip MeasurementsS. Ben Dhia; A. Boyer; B. Vrignon; M. Deobarro20122012, vol.28, no.3
NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded SystemsCesare Ferri; Dimitra Papagiannopoulou; R. Iris Bahar; Andrea Calimera20122012, vol.28, no.3
Challenges for Semiconductor Test Engineering: A Review PaperStefan R. Vock; Omar J. Escalona; Colin Turner; Frank J. Owens20122012, vol.28, no.3
Robust Coupling Delay Test SetsJoonhwan Yi; John P. Hayes20122012, vol.28, no.3



制造业外文文献服务平台