期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
ADC Multi-Site Test Based on a Pre-test with Digital Input StimulusXiaoqin Sheng; Hans Kerkhoff; Amir Zjajo; Guido Gronthoud20122012, vol.28, no.4
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model FittingShreyas Sen; Aritra Banerjee; Vishwanath Natarajan; Shyam Devarakond; Hyun Choi; Abhijit Chatterjee20122012, vol.28, no.4
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital CircuitsJudit F. Freijedo; Jorge Semiao; Juan J. Rodriguez-Andina; Fabian Vargas; Isabel C. Teixeira; J. Paulo Teixeira20122012, vol.28, no.4
On the Reuse of TLM Mutation Analysis at RTLValerio Guarnieri; Giuseppe Di Guglielmo; Nicola Bombieri; Graziano Pravadelli; Franco Fummi; Hanno Hantson; Jaan Raik; Maksim Jenihhin; Raimund Ubar20122012, vol.28, no.4
Cohesive Coverage Management: Simulation Meets Formal MethodsAritra Hazra; Priyankar Ghosh; Pallab Dasgupta; Partha Pratim Chakrabarti20122012, vol.28, no.4
Time-Constraint-Aware Optimization of Assertions in Embedded SoftwareViacheslav Izosimov; Giuseppe Di Guglielmo; Michele Lora; Graziano Pravadelli; Franco Fummi; Zebo Peng; Masahiro Fujita20122012, vol.28, no.4
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation MethodMichal Tadeusiewicz; Stanislaw Halgas20122012, vol.28, no.4
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM AbstractionNicola Bombieri; Franco Fummi; Valerio Guarnieri20122012, vol.28, no.4
Identifying Untestable Faults in Sequential Circuits Using Test Path ConstraintsTaavi Viilukas; Anton Karputkin; Jaan Raik; Maksim Jenihhin; Raimund Ubar; Hideo Fujiwara20122012, vol.28, no.4
Yield Improvement for 3D Wafer-to-Wafer Stacked MemoriesMottaqiallah Taouil; Said Hamdioui20122012, vol.28, no.4
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