期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2012, vol.28, no.1 2012, vol.28, no.2 2012, vol.28, no.3 2012, vol.28, no.4 2012, vol.28, no.5 2012, vol.28, no.6

题名作者出版年年卷期
Built-in Self Test of RF Subsystems with Integrated DetectorsChaoming Zhang; Ranjit Gharpurey; Jacob A. Abraham20122012, vol.28, no.5
Experimental Results of Testing a BIST E-A ADC on the HOY Wireless Test PlatformShao-Feng Hung; Hao-Chiao Hong20122012, vol.28, no.5
A Built-in Self-Test Scheme for Memory Interfaces Timing Test and MeasurementHyun Jin Kim; Jacob A. Abraham20122012, vol.28, no.5
FPGA-based Novel Adaptive Scheme Using PN Sequences for Self-Calibration and Self-Testing of MEMS-based Inertial SensorsElie H. Sarraf; Ankit Kansal; Mrigank Sharma; Edmond Cretu20122012, vol.28, no.5
On Chip Signal Generators for Low Overhead ADC BISTJingbo Duan; Bharath Vasan; Chen Zhao; Degang Chen; Randall Geiger20122012, vol.28, no.5
High Speed On-Chip Signal Generation for Debug and DiagnosisTsung-Yen Tsai; Sadok Aouini; Gordon Walter Roberts20122012, vol.28, no.5
Low-Distortion Sinewave Generation Method Using Arbitrary Waveform GeneratorKazuyuki Wakabayashi; Keisuke Kato; Takafumi Yamada; Osamu Kobayashi; Haruo Kobayashi; Fumitaka Abe; Kiichi Niitsu20122012, vol.28, no.5
Time-Based Embedded Test Instrument with Concurrent Voltage Measurement CapabilityKemal Kulovic; Martin Margala20122012, vol.28, no.5
Novel Practical Built-in Current SensorsSamed Maltabas; Kemal Kulovic; Martin Margala20122012, vol.28, no.5
On the Use of Static Temperature Measurements as Process Variation ObservableDidac Gomez; Josep Altet; Diego Mateo20122012, vol.28, no.5
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