期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan DesignsHaiying Yuan; Changshi Zhou; Xun Sun; Kai Zhang; Tong Zheng; Chang Liu; Xiuyu Wang20182018, vol.34, no.6
Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video EncryptionDragan Lambi?; Aleksandar Jankovi?; Musheer Ahmad20182018, vol.34, no.6
New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan AttacksVijaypal Singh Rathor; Bharat Garg; G. K. Sharma20182018, vol.34, no.6
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component AnalysisNabil El Belghiti Alaoui; Alexandre Boyer; Patrick Tounsi; Arnaud Viard20182018, vol.34, no.6
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell LibraryPablo Ilha Vaz; Thiago Hanna Both; Fábio Fedrizzi Vidor; Raphael Martins Brum; Gilson Inácio Wirth20182018, vol.34, no.6
EditorialVishwani D. Agrawal20182018, vol.34, no.6
A Simplified Calibration Methodology for On-Chip CouplersWei Jiang; Guoan Wang20182018, vol.34, no.6
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFTXu Bai; Hui Hu; Wanjun Li; Fulu Liu20182018, vol.34, no.6
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft ErrorXiaozhi Du; Dongyang Luo; Chaohui He; Shuhuan Liu20182018, vol.34, no.6
Generation Methodology for Good-Enough Approximate Modules of ATMRAbdus Sami Hassan; Tooba Arifeen; Hossein Moradian; Jeong-A Lee20182018, vol.34, no.6
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