期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
2017 JETTA-TTTC Best Paper Award 20182018, vol.34, no.6
Test Technology Newsletter 20182018, vol.34, no.6
Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable OrderingStelios N. Neophytou; Maria K. Michael20182018, vol.34, no.6
Multiple Missing Cell Defect Modeling for QCA DevicesVaishali H. Dhare; Usha S. Mehta20182018, vol.34, no.6
Generation Methodology for Good-Enough Approximate Modules of ATMRAbdus Sami Hassan; Tooba Arifeen; Hossein Moradian; Jeong-A Lee20182018, vol.34, no.6
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft ErrorXiaozhi Du; Dongyang Luo; Chaohui He; Shuhuan Liu20182018, vol.34, no.6
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFTXu Bai; Hui Hu; Wanjun Li; Fulu Liu20182018, vol.34, no.6
A Simplified Calibration Methodology for On-Chip CouplersWei Jiang; Guoan Wang20182018, vol.34, no.6
EditorialVishwani D. Agrawal20182018, vol.34, no.6
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell LibraryPablo Ilha Vaz; Thiago Hanna Both; Fábio Fedrizzi Vidor; Raphael Martins Brum; Gilson Inácio Wirth20182018, vol.34, no.6
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