期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.2
Handling Unknown with Blend of Scan and Scan CompressionPralhadrao V. Shantagiri; Rohit Kapur20182018, vol.34, no.2
EditorialVishwani D. Agrawal20182018, vol.34, no.2
Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular CavityYong Gao; En Li; Gaofeng Guo20182018, vol.34, no.2
The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular AutomataMengbo Sun; Hongjun Lv; Yongqiang Zhang; Guangjun Xie20182018, vol.34, no.2
Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer EnvironmentNaoki Terao; Toru Nakura; Masahiro Ishida; Rimon Ikeno; Takashi Kusaka; Tetsuya Iizuka; Kunihiro Asada20182018, vol.34, no.2
Detectability Challenges of Bridge Defects in FinFET Based Logic CellsFreddy Forero; Jean-Marc Galliere; Michel Renovell; Victor Champac20182018, vol.34, no.2
Application of Machine Learning Techniques in Post-Silicon Debugging and Bug LocalizationEman El Mandouh; Amr G. Wassal20182018, vol.34, no.2
Machine Learning for Hardware Security: Opportunities and RisksRana Elnaggar; Krishnendu Chakrabarty20182018, vol.34, no.2



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