期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.1
Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit DesignMasahiro Fujita; Virendra Singh; Toral Shah; Anzhela Matrosova20182018, vol.34, no.1
NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment ApproachYang Yu; Jie Liang; Zhiming Yang; Xiyuan Peng20182018, vol.34, no.1
Automation of Test Program Synthesis for Processor Post-silicon ValidationVasudevan Madampu Suryasarman; Santosh Biswas; Aryabartta Sahu20182018, vol.34, no.1
EditorialVishwani D. Agrawal20182018, vol.34, no.1
New Editor – 2018 20182018, vol.34, no.1
Exploring System Availability During Software-Based Self-Testing of Multi-core CPUsMichael A. Skitsas; Chrysostomos A. Nicopoulos; Maria K. Michael20182018, vol.34, no.1
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoCXiaozhi Du; Dongyang Luo; Kailun Shi; Chaohui He; Shuhuan Liu20182018, vol.34, no.1
Vulnerability Analysis of Adder Architectures Considering Design and Synthesis ConstraintsMostafa Salehi; Ali Azarpeyvand; Armin Hajaboutalebi Aboutalebi20182018, vol.34, no.1
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoCDavide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini20182018, vol.34, no.1



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